The United States Patent and Trademark Office (USPTO), in conjunction with the USPTO-Patent Public Advisory Committee joint task force on quality, is conducting a roundtable to obtain input from organizations and individuals on actions that can improve patent quality and the metrics to be used to measure quality. The roundtable will be held on Tuesday, May 18, from 8:30 a.m. to 12 noon EDT. It will take place at the USPTO in the auditorium on the concourse level of the Madison Building located at 600 Dulany Street, Alexandria, Va., and is open to the public.
“Quality patents are critical to the proper functioning of the patent system, and issuing high quality patents is a top priority for the USPTO,” said Under Secretary of Commerce for Intellectual Property and Director of the USPTO David Kappos. “Quality issuances provide certainty in the market and allow businesses and innovators to make informed and timely decisions on product and service development.”
Under Secretary Kappos and Marc Adler, member of the Patent Public Advisory Committee, will act as moderators for the roundtable.
Any member of the public may submit written comments on USPTO patent quality enhancement and metrics as well as on any issue raised at the roundtable. The deadline for receipt of written comments is June 18, 2010.
The roundtable will be webcast, and information is available on the USPTO's Web site.
James Lindon, Ph.D. Patent Attorney
Lindon & Lindon, LLC
Patents, Trademarks, Copyrights, Pharmacy Law, Litigation
[this is not legal advice - provided for discussion only]
Intellectual Property for the Individual and Small Business: Identify, Protect, Enforce, Defend.
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